泰瑞达芯片测试开发工程师就业班详细课程大纲

序号

课程内容

Day1

• 芯片设计基本流程

产品规格

架构算法

RTL代码

仿真验证

工艺选择

综合、时序、功耗分析

形式验证

自动布局布线

制造

封装

测试

Day2

• 测试开发流程

测试需求

测试需求分析

测试计划

DFT方案与实施

IP测试方案与实施

测试程序开发

测试治具设计

测试治具制造

测试程序调试

测试量产导入

Day3,4

• 向量转换工具介绍与使用

TDL工具简介

VCD2STIL使用介绍

ATEgen使用介绍

Waver使用介绍

Timing editor使用介绍

项目实践

Day5,6

• 测试硬件的介绍与使用

Loadboard设计、仿真

Socket设计、仿真

Probecard设计

Changekit设计

Day7

• 工艺基础知识

光刻工艺简介

CVD工艺

Sputter工艺

蒸发工艺

I/I工艺

扩散工艺

湿法刻蚀

干法刻蚀

Day8,9

• DFT基础知识

Mbist介绍

Scan介绍

JATG-TAP/ATPG介绍

ATE测试故障诊断（Diagnosis）

Day10

• 封装基础知识

什么是封装

为什么要封装

封装的形式

封装的流程

封装的发展和趋势

序号

课程内容

Day1：

• Introduction to Semiconductor Testing
  Design and manufacturing cycle of an IC
  Semiconductor Companies/Staffs
  ATE – Automated Test Equipment and its components
  Load boards, Probe cards, Handlers, Probers
• Test Plan, Specifications and Test Program
  Test Plan – Introduction, Benefits, Requirement, Sample
  Specifications – Design specs, Test specs, Device specs
  Types of Test Programs
  Consideration, Test Flow, Binning, Summary
  Common and Specific Type of tests for Semiconductor Device
  Functional, DC, AC Specifications of Device

Day2

• DC Parameters Test (including Continuity Test)
  Continuity Test - Concept, Test Method, Sample Datalog
  DC Tests – Concept and Test Method
  Power Supply Current Test (IDD) Leakage Test (IIL/IIH)
  Other Current/Voltage Test (IOZL/IOZH, IOS, VOL/IOL, VOH/IOH)
  ATE DC Subsystem - VI Source, DC Meter, DC Matrix, Relay Control
  Taking care of Hot switching
• Digital Functional Test
  ATE Pin Electronics
  Test Concepts – Pattern, Timing, Levels
  IO Signals – Signal Formats, Input Signal Generation, Output Signal Compare
  Functional Testing Basic – Example VIL/VIH, VOL/VOH
  Test Vectors

Day3

• AC Parameters Test
  AC Timing Tests - Setup Time, Hold Time, Propagation Delay, etc
  ATE Time Measurement Subsystem
  Timing Calibration
• Introduction to Mixed Signal Testing
  Sampling Theory – Nyquist Theorem, Coherency Formula
  Fast Fourier Transform (FFT) – Frequency Domain Analysis
  Generic Mixed Signal Tester Architecture – AWG and Digitizer

Day4

• ADC and DAC Test
  ADC and DAC Basic
  Static Test – Histogram method (INL, DNL)
  Dynamic Test – SNR, THD, SINAD

Day5

• Debug Tools and Debugging
  Tools - Datalog, Histogram, Shmoo, Pattern Debugger, Waveform Tool
  Trouble-Shooting Techniques
• Introduction to Design-For-Testability
  DFT consideration
  Test Approach – AdHoc , Scan (and Boundary Scan), Self-Test (BIST)

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课程内容

Day1：

• Test System Tester Overview

J750 system Diagram

 512/1024 pin configuration

J750 Programmable Components

 Device Interface Board

 Calibration/Checkers

         System Overview

        System Computer Requirements       IGXL Software  Test Program Overview

         Running a Test Program

        Basic IGXL Workbook Operations DUT o Tester Interface

        Overview – Tester Resources/Device Datasheet

         Pin map

         Channel Map

         Lab Exercise

Day2

• DC Tests

         DC Levels Overview

         Global Specs Worksheet

         Pin Levels Worksheet

         DC Specs Worksheet

         Test Instances

         PinPMU Template

         BoardPMU Template

         Flow Table

         Lab Exercise

                 DC Test Debug

         Flow Table Debug

         Debug Display Tools

         Lab Exercise

Day3

• Functional Tests

        Digital Subsystem Overview

         Waveform Programming

         Time Sets and Edge Sets

         Functional Test Template

         Lab Exercise

                 Patterns

        Pattern Execution Overview

         Pattern Files

Day4

• Pattern Tools

         Pattern Sets and Groups

         Pattern Debug

         Pattern Opcodes

         Lab Exercise

Day5

• Characterization

         Overview/ Concepts

        Characterization Worksheet

         Shmoo, Margin, Adjust, Measure

                 Custom Coding

        Visual Basic Overview

        Creating Interpose Functions

         Using Visual Basic Editor for Debug

         Lab Exercise

                 Q&A

序号

课程内容

 Day1：

• J70EX-HD HSD800 
• WW2 IGXL Datatool Programming Concept Review with HSD800

         IGXL Basic WorkSheet Review       

         Pattern and Timing mode Review   

         HSD800 Instrument Overview

         Hardware Overview and Instrument Block Diagram

         HSD800 Compatible mode and Unique features     

                 Lab Exercise

Day2

• J70EX-HD HDCTO  
• HDCTO Hardware Overview  

         Lists of Channel groups 

         Specification of each channel  Block diagram of Channel groups       

        HDCTO PMU Program Overview     

         Instance Editor       

        IGXL WorkSheet Programming with HDCTO    

         Debug Display Tools      

        HDCTO Capture Program Overview

         Instance Editor       

         HDCTO Pattern Capture Microcode

         Debug Display Tools      

        Lab Exercise

Day3

• HDCTO Source Program Overview

         Instance Editor       

        HDCTO Source Analysis Routines   

        HDCTO Pattern Source Microcode  

         DSIO Overview      

        DSIO Pattern Capture Microcode     

         Capture HRAM      

        Lab Exercise   

• J750EX-HD HDDPS
• HDDPS Instrument Overview

         Instrument Features       

         Hardware block diagram and Architecture       

        HDDPS Programming Overview       

        IGXL WorkSheet Programming with HDDPS    

         Instance Editor and VBT

         Debug Display Tools      

        Lab Exercise

Day4

• Course Content Review and Q&A

Day5

• Offline Course Examination  
• Mini Project Introduction       

         Device Datasheet  

         Test Plan

        Project deliverable materials requirement

序号

课程内容

Day1

• Schedule and Plan

Day2

• Schematic

Day3

• Offline coding

Day4

• Offline coding

Day5

• Offline coding

Day6

• Online debug

Day7

• Online debug

Day8

• Datalog collect

Day9

• Report

Day10

• Review